Verified
来源、主体与时间与首次落库记录一致。
| 文章 | Reliable Power-Path Design: Integrating MOSFETs, Diodes, TVS Devices, and Capacitors |
| 信任等级 | Aggregate |
| 发布主体 | — |
| 来源 | https://www.eetimes.com/reliable-power-path-design-integrating-mosfets-diodes-tvs-devices-and-capacitors/ |
| 创建时间 | Wednesday, 26 August 2026 - 21:31 |
| 已记录哈希 | f082950129e32268e4c1c3bcf642b6eba191df5ca11ae60a63f1ceb9228f1a26 |
| 重算哈希 | f082950129e32268e4c1c3bcf642b6eba191df5ca11ae60a63f1ceb9228f1a26 |
哈希算法:sha256(来源URL|主体ID|创建时间戳),主体缺失时主体ID为 0。